Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2005-08-02
2005-08-02
Mehta, Bhavesh M. (Department: 2625)
Image analysis
Applications
Manufacturing or product inspection
C348S086000
Reexamination Certificate
active
06925201
ABSTRACT:
The present invention provides an inspection apparatus for an electrode plate-connected structure for a secondary cell for inspecting each bonding portion of an electrode plate-connected structure for a secondary cell including a plurality of electrode plates which are arranged in parallel to one another at prescribed intervals and are perpendicularly connected to a power collecting plate. The apparatus is characterized by including: a lighting section for irradiating light to each of the bonded portions of the plurality of electrode plates and the power collecting plate; a light receiving section for detecting a projected image of each of the bonded portions based on the light irradiated to the electrode plate-connected structure by the lighting section; and an evaluation section for evaluating a bonding state of each of the bonding portions based on the projected image of each of the bonded portions detected by the light receiving section.
REFERENCES:
patent: 3773422 (1973-11-01), Stavis et al.
patent: 6249598 (2001-06-01), Honda et al.
patent: 08-287962 (1996-11-01), None
patent: 11073948 (1999-03-01), None
patent: 2000-100465 (2000-07-01), None
Nakagawa Yugo
Nakanishi Toshiaki
Snell & Wilmer L.L.P.
Strege John
Toyota Jidosha & Kabushiki Kaisha
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