Dynamic magnetic information storage or retrieval – Monitoring or testing the progress of recording
Reexamination Certificate
2003-01-21
2010-10-19
Olson, Jason C (Department: 2627)
Dynamic magnetic information storage or retrieval
Monitoring or testing the progress of recording
C360S025000, C360S032000, C714S042000
Reexamination Certificate
active
07817362
ABSTRACT:
An inspection apparatus and method are disclosed for inspecting a magnetic disk or a magnetic head. A first reference signal generating source generates reference signals of a controllable oscillating frequency, and a signal switching means selects either a reference signal or test data reproduced by the magnetic head. Factors such as offsets and gain differentials among signal distribution paths, phase shifts of sampling clocks supplied to a plurality of AID converters, and frequency-dependence of the transfer function and phase response of signal paths are identified so that errors due to these factors can be detected. Based on the detected values of these factors and errors, reference signals are utilized to compensate test data errors.
REFERENCES:
patent: 4901165 (1990-02-01), Matsuo
patent: 5386323 (1995-01-01), Ishiwata et al.
patent: 6510013 (2003-01-01), Oshio
patent: 04-036608 (1992-02-01), None
patent: 04-105423 (1992-04-01), None
patent: 06-124138 (1994-05-01), None
patent: 09-084248 (1997-03-01), None
patent: 2001-184602 (2001-07-01), None
Japanese Patent Office dated Dec. 5, 2006.
Homma Shinji
Li Wen
Orihashi Ritsuro
Takahashi Masayoshi
Antonelli, Terry Stout & Kraus, LLP.
Hitachi , Ltd.
Olson Jason C
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