Inspection apparatus

Television – Camera – system and detail – Combined image signal generator and general image signal...

Reexamination Certificate

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C348S246000

Reexamination Certificate

active

07864230

ABSTRACT:
An inspection apparatus for inspecting a microarray comprises an image sensor for imaging the microarray, a moving means for moving the image sensor relative to the microarray, a memory for memorizing the position of a defective picture element on the image sensor, and a controlling means which determines an overlap state of an imaging area of the defective picture element on reaction areas on the microarray and controls the moving means based on the result of the determination.

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patent: 6661456 (2003-12-01), Aufrichtig et al.
patent: 6980677 (2005-12-01), Niles et al.
patent: 2001/0008418 (2001-07-01), Yamanaka et al.
patent: 2002/0062202 (2002-05-01), Arai
patent: 2003/0174902 (2003-09-01), Barkan
patent: 2004/0174320 (2004-09-01), Matthijs et al.
patent: 2005/0196778 (2005-09-01), Yamamoto et al.
patent: 2006/0275893 (2006-12-01), Ishii et al.
patent: 2005-181145 (2005-07-01), None

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