Television – Camera – system and detail – Combined image signal generator and general image signal...
Reexamination Certificate
2011-01-04
2011-01-04
Ye, Lin (Department: 2622)
Television
Camera, system and detail
Combined image signal generator and general image signal...
C348S246000
Reexamination Certificate
active
07864230
ABSTRACT:
An inspection apparatus for inspecting a microarray comprises an image sensor for imaging the microarray, a moving means for moving the image sensor relative to the microarray, a memory for memorizing the position of a defective picture element on the image sensor, and a controlling means which determines an overlap state of an imaging area of the defective picture element on reaction areas on the microarray and controls the moving means based on the result of the determination.
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Canon Kabushiki Kaisha
Fitzpatrick ,Cella, Harper & Scinto
Monk Mark
Ye Lin
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