Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1996-03-04
1997-12-02
Wieder, Kenneth A.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324537, G01R 3126
Patent
active
056940513
ABSTRACT:
A method and apparatus for inspecting a transistor in an inverter circuit includes turning on only the transistor of the inverter circuit. A predetermined collector current is supplied to the transistor until a transistor junction temperature reaches a predetermined temperature. The transistor is acceptable if a difference between a transistor collector-to-emitter voltage when the predetermined collector current is supplied and a transistor collector-to-emitter voltage when the junction temperature reaches the predetermined temperature falls within a preset range. Switching elements of the inverter circuit are controlled to supply a current through a resistor to charge an electrolytic capacitor of the inverter circuit. A voltage across the electrolytic capacitor during charging and a time period is measured from the beginning of charging until a time when a voltage across the electrolytic capacitor attains a predetermined voltage. An electrostatic capacitance of the electrolytic capacitor is determined based on the measured time period and a resistance value of the resistor. The electrolytic capacitor is discharged and a discharging voltage and current are measured. An equivalent series resistance of the electrolytic capacitor is determined based upon the voltage of the electrolytic capacitor at the beginning of discharge, the electrolytic capacitance and the measured discharge voltage and current.
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Brosch, "Falsch Ist Rasch Gemessen", Elektrotechnik vol. 73, No. 4 Apr. 2, 1991, pp. 62-70.
Takano Fumitomo
Tsukada Yoshinari
Ueyama Atsushi
Brown Glenn W.
Honda Giken Kogyo Kabushiki Kaisha
Wieder Kenneth A.
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