Inspecting swath boundaries produced by thermal transfer of...

Details Inspecting swath boundaries produced by thermal transfer of... Inspecting swath boundaries produced by thermal transfer of...

2006-06-20

2006-06-20

Coleman, W. David (Department: 2823)

Semiconductor device manufacturing: process

With measuring or testing

C347S234000

Reexamination Certificate

active

07063990

ABSTRACT:
A method of inspecting an OLED device to locate and characterize defects in the registration of organic material(s) transferred from a donor in swaths in response to heat produced by a multichannel laser print head includes optically inspecting the OLED device after or during manufacture to identify the boundaries between swaths of transferred organic material(s), and determining if the swaths overlap at a seam of the boundary or if there is a gap between swath edges at the seam or if there is an offset between the edges of adjacent swaths.

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patent: WO 2005/022661 (2005-03-01), None

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