Inspecting method and apparatus for foreign matter

Details Inspecting method and apparatus for foreign matter Inspecting method and apparatus for foreign matter

2005-06-28

2005-06-28

Porta, David (Department: 2878)

Radiant energy

Invisible radiant energy responsive electric signalling

Infrared responsive

C250S343000, C250S339060

Reexamination Certificate

active

06911653

ABSTRACT:
An object being inspected that contains a liquid product is irradiated with light from a first side face thereof and with light given with a tilt from either side of a second side face opposite to the first side face with respect to the object being inspected, transmitted light and reflected light from the object being inspected are received by imaging means provided at the second side face, and an image signal from the imaging means is processed, whereby a foreign matter got entered the liquid product is detected based on the image processing. Consequently, it is possible to provide inspecting method and apparatus for a foreign matter for use in a production line for manufacturing liquid products, such as drinks and liquid drugs, which can detect, at a high speed in a reliable manner, whether a foreign matter has entered a liquid inside a container, such as a bottle or a PET bottle, and a foreign matter got entered a colored bottle or PET bottle or a colored liquid as well.

REFERENCES:
patent: 4197457 (1980-04-01), Cheo
patent: 4241256 (1980-12-01), Tagaya et al.
patent: 4367405 (1983-01-01), Ford
patent: 4402612 (1983-09-01), Alexander et al.
patent: 4914289 (1990-04-01), Nguyen et al.
patent: 4943713 (1990-07-01), Yoshida
patent: 5072108 (1991-12-01), Ishikawa
patent: 5256871 (1993-10-01), Baldwin
patent: 5444237 (1995-08-01), Takizawa
patent: 5486692 (1996-01-01), Baldwin
patent: 5489692 (1996-02-01), Hirschmann et al.
patent: 5495330 (1996-02-01), Champaneri et al.
patent: 5536935 (1996-07-01), Klotzsch et al.
patent: 5591899 (1997-01-01), Griesbeck
patent: 5661294 (1997-08-01), Buchmann et al.
patent: 5748305 (1998-05-01), Shimono et al.
patent: 5864395 (1999-01-01), Laurberg
patent: 5905595 (1999-05-01), Minami
patent: 5926268 (1999-07-01), Bonewitz et al.
patent: 6067155 (2000-05-01), Ringlien
patent: 6175107 (2001-01-01), Juvinall
patent: 6275603 (2001-08-01), Cronshaw et al.
patent: 6737651 (2004-05-01), Lendl
patent: 2002/0154809 (2002-10-01), Yamagishi et al.
patent: 2003/0142299 (2003-07-01), Kwirandt
patent: 2003/0214649 (2003-11-01), Yagita
patent: 2002-221498 (2002-08-01), None

Affiliated with

Also associated with

Rating

Inspecting method and apparatus for foreign matter does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Inspecting method and apparatus for foreign matter, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Inspecting method and apparatus for foreign matter will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3498516