Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2007-12-04
2007-12-04
Nguyen, Ha Tran (Department: 2829)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S1540PB, C349S043000, C349S054000
Reexamination Certificate
active
11369370
ABSTRACT:
An inspecting circuit layout according to the present invention is provided. The inspecting circuit layout is adapted for inspecting panel units group by group, each of the panel units having a plurality of first and second signal lines. The inspecting circuit layout includes a multiplexer (MUX) and an inspecting pad. The MUX is electrically connected with at least one of the first or second signal lines of the panel units, and the inspecting pad is electrically connected to the MUX. The MUX is adapted for selectively connecting the inspecting pad with the first or second signal lines of a group of panel units.
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Chen Chih-Yu
Liou Meng-Chi
Shiau Fu-Yuan
Chan Emily Y
Chunghwa Picture Tubes Ltd.
J.C. Patents
Nguyen Ha Tran
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