Inspecting apparatus and method for foreign matter

Details Inspecting apparatus and method for foreign matter Inspecting apparatus and method for foreign matter

2008-03-11

2008-03-11

Toatley, Jr., Gregory J. (Department: 2877)

Optics: measuring and testing

Inspection of flaws or impurities

Transparent or translucent material

C250S22300B

Reexamination Certificate

active

07342655

ABSTRACT:
An inspecting apparatus for detecting a foreign matter in a container having a recessed and protruding shape includes: illumination units arranged annularly on inner and outer sides of an annular carrier line and casting parallel lights onto the inspection subject from the outside thereof; image pickup units arranged on the outside of the annular carrier line and receiving lights from the inspection subject, simultaneously from two directions around the inspection subject, and picking up images of the inspection subject; wherein the image pickup units pick up images of the inspection subject in a state where an angle θ1formed by light-receiving axes of the image pickup units is 30 to 90 degrees and an angle θ2formed by the light-receiving axis of the image pickup unit and the light of the illumination unit next to the image pickup unit is 30 to 60 degrees.

REFERENCES:
patent: 4025201 (1977-05-01), Deane
patent: 4280624 (1981-07-01), Ford
patent: 4500203 (1985-02-01), Bieringer
patent: 4691231 (1987-09-01), Fitzmorris et al.
patent: 5256871 (1993-10-01), Baldwin
patent: 6911653 (2005-06-01), Yagita
patent: 6914672 (2005-07-01), Yagita
patent: 2001-221746 (2001-08-01), None
patent: 2003-315280 (2003-06-01), None

Affiliated with

Also associated with

Rating

Inspecting apparatus and method for foreign matter does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Inspecting apparatus and method for foreign matter, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Inspecting apparatus and method for foreign matter will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2814684