Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-10-25
2005-10-25
Zarneke, David (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
06958619
ABSTRACT:
The present invention provides an apparatus and method for inspecting a circuit board at a high speed. A PDP driver module100as an object to be inspected has an onboard PDP driving LSI110. A plurality of circuit wirings111are connected to terminals of the LSI. An inspection apparatus1generates an LSI drive signal and sends it to input terminals113of the LSI110. A sensor2is positioned opposedly to the circuit wirings111in a non-contact manner. The sensor2detects voltage values in circuit wirings111caused by driving the LSI110, and the detected signals are analyzed by the inspection apparatus1.
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Ishioka Shogo
Yamaoka Shuji
Hollington Jermele
OHT Inc.
Westerman Hattori Daniels & Adrian LLP
Zarneke David
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