Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-01-11
2005-01-11
Pert, Evan (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S754090
Reexamination Certificate
active
06842026
ABSTRACT:
The present invention provides an apparatus and method for inspecting a circuit board at a high speed. An LCD driver module100as an object to be inspected has an onboard LCD driving LSI110.One circuit-wiring group111is connected to SEG terminals, and another circuit-wiring group112is connected to COM terminals of the LSI110.An inspection apparatus1generates an LSI drive signal and sends it to input terminals113of the LSI110.A pair of sensors2, 3are positioned opposedly to the circuit-wiring groups111, 112,respectively, in a non-contact manner. Each of the sensors2, 3detects voltage changes in the corresponding circuit-wiring group111, 112caused by driving the LSI110,and the detected signals are analyzed by the inspection apparatus1.
REFERENCES:
patent: 5017864 (1991-05-01), Kaida et al.
patent: 5254953 (1993-10-01), Crook et al.
patent: 5686994 (1997-11-01), Tokura
patent: 5757193 (1998-05-01), Yu et al.
patent: 5969530 (1999-10-01), Yamashita
patent: 6097202 (2000-08-01), Takahashi
patent: 6160409 (2000-12-01), Nurioka
patent: 6201398 (2001-03-01), Takada
patent: 6456102 (2002-09-01), Mori et al.
patent: 6710607 (2004-03-01), Fujii et al.
patent: 20020135390 (2002-09-01), Fujii et al.
patent: 20020180455 (2002-12-01), Okano et al.
patent: 9-264919 (1997-10-01), None
Patent Abstract of Japan, Publication No. 2000-131393, dated May 12, 2000. See PCT search report.
Ishioka Shogo
Yamaoka Shuji
Hollington Jermele
OHT Inc.
Pert Evan
Westerman Hattori Daniels & Adrian LLP
LandOfFree
Inspecting apparatus and inspecting method for circuit board does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Inspecting apparatus and inspecting method for circuit board, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Inspecting apparatus and inspecting method for circuit board will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3435222