Insert block with pusher to push semiconductor device under...

Details Insert block with pusher to push semiconductor device under... Insert block with pusher to push semiconductor device under...

2006-12-19

2006-12-19

Patel, Paresh (Department: 2829)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

C439S259000, C439S296000

Reexamination Certificate

active

07151368

ABSTRACT:
The present invention relates to an insert block for testing semiconductor devices. The insert block comprises one or more pushers, installed in a block body having a loading space to accommodate a semiconductor device under test, including a first push rod to apply force to one of adjacent sides of the semiconductor device under test and a second push rod to apply force to the other thereof.Accordingly, firm centering of semiconductor devices under test relative to the contact pins of the test socket along the two perpendicular axes (for instance, x and y axes) on the top or bottom surface of the semiconductor device is achieved and leads to the proper interfaces between the external terminals of the semiconductor device under test and the contact pins of the test socket, and thereby improves the quality of connection therebetween.

REFERENCES:
patent: 3466514 (1969-09-01), Brunner et al.
patent: 5017056 (1991-05-01), Morash
patent: 6043667 (2000-03-01), Cadwallader et al.
patent: 6128074 (2000-10-01), Hong et al.
patent: 6425178 (2002-07-01), Lee et al.
patent: 6446951 (2002-09-01), Nuxoll et al.
patent: 6802728 (2004-10-01), Howell et al.
patent: 11-287842 (1999-10-01), None
patent: 2002-61879 (2002-07-01), None
patent: 2003-59992 (2003-07-01), None
patent: 2004-0029563 (2004-04-01), None
English language abstract of Korean Publication No. 2002-61879, 2002.
English language abstract of Korean Publication No. 2003-59992, 2003.
English language abstract of Japanese Publication No. 11-287842, 1999.

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