Coded data generation or conversion – Analog to or from digital conversion – Analog to digital conversion
Reexamination Certificate
2007-02-27
2008-07-08
Mai, Lam T (Department: 2819)
Coded data generation or conversion
Analog to or from digital conversion
Analog to digital conversion
C341S155000
Reexamination Certificate
active
07397410
ABSTRACT:
A quantization circuit includes a plurality of resistors, a plurality of tap points, and a plurality of coarse comparators. Each coarse comparator has a first input coupled to an input voltage and a second input coupled to a corresponding coarse tap point voltage. Each coarse comparator operates during a first phase to produce a “1” only if the input voltage exceeds the corresponding coarse tap point voltage. A plurality of fine comparators each have a first input coupled to the input voltage, and each fine comparator operates during a second phase to produce a fine output level indicative of whether the input voltage exceeds a corresponding tap point voltage of a group of tap points located immediately below the tap point connected to the highest coarse comparator producing a “1”.
REFERENCES:
patent: 6697005 (2004-02-01), Mulder
patent: 6784818 (2004-08-01), Mulder
patent: 7256725 (2007-08-01), Mulder
patent: 7271755 (2007-09-01), Mulder et al.
“A 3-mW 74-dB SNR 2-Hmz Continuous-Time Delta-Sigma ADC With a Tracking ADC Quantizer in 0.13-μm CMOS” by Lukas Dörrer et al., IEEE Journal of Solid-State Circuits, vol. 40, No. 12, Dec. 2005, pp. 2416-2427.
Brady III Wade J.
Mai Lam T
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
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