Input stage for a charge transfer device (CTD) arrangement

Details Input stage for a charge transfer device (CTD) arrangement Input stage for a charge transfer device (CTD) arrangement

1980-12-22

1982-02-02

Munson, Gene M.

Electrical transmission or interconnection systems

Nonlinear reactor systems

Parametrons

357 24, 333165, G11C 1928, H01L 2978, H03H 1502

Patent

active

043141633

ABSTRACT:
The invention relates to an input stage for a charge transfer device (CTD) arrangement which contains a source zone in a semiconductor body, two input electrodes, and a transfer gate, wherein one input gate is connected to a fixed voltage, and the other input gate is supplied with an analog input signal. In input stages of this kind, it is endeavored to evaluate the input signal within the widest possible limits without the need of altering the assigned semiconductor surface. The invention achieves this aim in that the input stage is divided into two input channels which possess different widths and which open into the CTD channel. A positive evaluation of the input signal is carried out via the first input channel, whereas a negative evaluation is carried out via the second input channel. The difference in area between the second input gate electrodes of the two input channels represents a gauge of the evaluation coefficient and can be kept very small. The range of application of the invention covers arbitrary CTD circuits, and in particular CTD transversal filters.

REFERENCES:
patent: 4056737 (1977-11-01), Sequin
patent: 4071775 (1978-01-01), Hewes
patent: 4163957 (1979-08-01), Knauer et al.
patent: 4188597 (1980-02-01), Knauer
patent: 4233578 (1980-11-01), Knauer et al.
Sealer et al., "A Dual Differential Charge-Coupled Analog Delay Device", IEEE J. Solid-State Circuits, vol. SC-11 (2/76), pp. 105-108.

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