Input circuit for a probe of a logic analyser and probe and logi

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Self-calibration

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324 725, 341118, G01R 1906, G01R 1900

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active

048034231

ABSTRACT:
A high frequency probe for a logic analyzer adapted to operate with different types of logic circuits, and signals which may or may not be superimposed on a dc component. After an input capacitance, a high frequency amplifier feeds both an output terminal and a compensator circuit which compares the deviation between low frequency or dc components appearing at the input and output terminals, and compensates for the deviation by reinjecting a signal at the input of the high frequency amplifier. Variable attenuation may also be also be included between the high frequency amplifier and the output terminal.

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"DVM Reaches 10 nV Sensitivity Through Novel Front-End Design", by Dance, Electron. Industry, 11/80, pp. 14-20.
"Study of Space Potential Matter", by Minami et al., Mem. Fac. Eng., Osaka City Univ. (Japan), vol. 16, 12/75, pp. 55-62.

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