Innovative method of correlated double sample (CDS) circuit...

Coded data generation or conversion – Converter calibration or testing

Reexamination Certificate

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C341S118000, C341S155000

Reexamination Certificate

active

10294163

ABSTRACT:
The present invention comprises a test set-up (20) and method of testing a correlated double sampling circuit (CDS) (24) by using a sinusoidal test signal (22) for measuring linearity. The present invention generates a sinusoidal signal with two accurate and known levels at two different time points, as an input to the CDS. The cosinusoidal output of the CDS is then processed using an ADC (60) and processor (62) to check the functionality and linearity of the CDS circuit under test.

REFERENCES:
patent: 5406329 (1995-04-01), Kashimura et al.
patent: 5937100 (1999-08-01), Kitajima
patent: 5963885 (1999-10-01), Macq
patent: 6614378 (2003-09-01), Miyazaki et al.
patent: 6657668 (2003-12-01), Hata
patent: 6903670 (2005-06-01), Lee et al.

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