Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent
1992-11-09
1994-07-19
Willis, Davis L.
Optics: measuring and testing
Inspection of flaws or impurities
Having predetermined light transmission regions
356394, 250561, 250562, 348126, G01N 2189, G01B 1124
Patent
active
053313976
ABSTRACT:
An inner lead bonding inspecting method comprises the steps of: irradiating an illumination light onto the planar surface of a bonding portion between an electrode bump provided on a semiconductor pellet and an inner lead, measuring the quantity of reflected light from the surface, and judging whether the bonding state of the inner lead bonding is good or bad on the basis of the measured result. According to another aspect, an inner lead bonding inspecting apparatus comprises any irradiation device for irradiating a light onto a planar surface of a bonding portion between an electrode bump provided on a semiconductor pellet and an inner lead; a light quantity measurement device for measuring the quantity of reflected light from the inner lead surface, and a judging device for comparing the measured quantity of reflected light with a reference light quantity, to judge the quality of the bonding state.
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Shibasaka Mitsusada
Yamanaka Kazuyuki
Kabushiki Kaisha Toshiba
Pham Hoa Q.
Willis Davis L.
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