Infrared thickness measuring device

Details Infrared thickness measuring device Infrared thickness measuring device

1981-05-29

1984-01-31

Willis, Davis L.

Radiant energy

Invisible radiant energy responsive electric signalling

Infrared responsive

250339, 250341, 2503581, G01J 100

Patent

active

044292252

ABSTRACT:
A device for measuring the thickness of a thin film or the like is provided using infrared rays. A source of infrared rays is positioned on one side of the film. A disk with two apertures is rotatably mounted between the infrared source and the film, with band-pass filters positioned over the apertures in the disk. A concave hemispherical reflector with a reflector surface facing the film is positioned between the infrared source and the film. A hole is formed in the center of the concave reflector through which the infrared rays pass. A convex reflector is positioned between the film and the concave reflector and has a reflecting surface facing the concave reflector. A light collecting guide with a photoelectric sensor is positioned on the opposite side of the film from the infrared source for measuring the intensity of the infrared rays.

REFERENCES:
patent: 3631526 (1971-12-01), Brunton
patent: 3693025 (1972-09-01), Brunton
patent: 4015127 (1977-03-01), Sharkins
patent: 4027161 (1977-05-01), Williams et al.
Technical Article by Roger F. Edgar Entitled "Uses of the Infrared Absorption Gauge for On-Line Gauging of Coatings and Film Thickness".

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