Infrared spectropolarimeter

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250353, G01J 3447

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active

050457012

ABSTRACT:
An infrared spectropolarimeter system for making spectroscopic measurements of electro-optic properties of materials over a large wavelength range in the infrared is described which comprises in combination a spectrometer having a sample region for receiving a sample for making spectroscopic measurements thereon and a source of light for providing a sample beam of selected wavelength for projection through the sample region, the sample region defined between a first focusing element for selectively focusing the sample beam within the sample region and a second focusing element for collimating the sample beam and providing an output beam for analysis, first and second polarizers between the focusing elements with the sample region therebetween for selectively polarizing the sample beam, first and second rotatable optical retarders between the polarizers with the sample region therebetween for selectively retarding one linear polarization component with respect to the orthogonal component of the sample beam, and a detector for analyzing the output beam.

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patent: 3741660 (1973-06-01), Abu-Shumays et al.
patent: 4440013 (1984-04-01), Adams
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patent: 4917461 (1990-04-01), Goldstein
"Photo Polarimetric Measurement of the Mueller Matrix by Fourier Analysis of a Single Detected Signal", R. M. A. Azzam, Opt. Lett. 2(6): 148 (1978).
"Mueller Matrix Ellipsometry with Imperfect Compensators", P. S. Hauge, J. Opt. Soc. Am. 68(11): 1519 (1978).

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