Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1996-04-03
1997-05-20
Wieder, Kenneth A.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324658, 374 731, G01R 3128, G01R 3126, G01R 1900
Patent
active
056315716
ABSTRACT:
A system for functionally testing opto-electronic devices, such as fiber-optic infrared receiver photodiodes, in the integral wafer or other optical port-exposed status. The testing arrangement uses a portable optical probe for communicating optical signals between the testing apparatus and the tested device in coincidence with electrical energization and functional operation of the electro-optical device by the test apparatus. The optical probe signals may be correlated in time relationship or other manner with the electrical signals applied-to the device-under-test. The invention provides simple conversion between a conventional electrical semiconductor device probe station and an electro-optical device probe station.
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Spaziani Stephen
Vaccaro Kenneth
Waters William
Bowser Barry C.
Hollins Gerald B.
Kundert Thomas L.
The United States of America as represented by the Secretary of
Wieder Kenneth A.
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