Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate
2008-01-22
2008-01-22
Toledo, Fernando L. (Department: 2823)
Semiconductor device manufacturing: process
With measuring or testing
C438S149000, C250S338100
Reexamination Certificate
active
07320896
ABSTRACT:
Electronic devices are disclosed that may be used for infrared radiation detection. An example electronic device includes a substrate, a transistor included in the substrate and a silicon-germanium (Si—Ge) structural layer coupled with the transistor. The structural layer has a stress in a predetermined range, where the predetermined range for the stress is selected prior to deposition of the structural layer. Also, the structural layer is deposited on the substrate subsequent to formation of the transistor such that deposition of the structural layer does not substantially adversely affect the operation of the transistor.
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Baert Christiaan
Caymax Matty
Fiorini Paolo
Sedky Sherif
Interuniversitair Microelektronica Centrum (IMEC)
McDonnell Boehnen & Hulbert & Berghoff LLP
Toledo Fernando L.
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