Optical: systems and elements – Compound lens system – Microscope
Patent
1997-05-08
1998-05-19
Nguyen, Thong
Optical: systems and elements
Compound lens system
Microscope
348 79, 359369, 359738, G02B 2100, H04N 718
Patent
active
057543356
ABSTRACT:
Before a measurement for an infrared analysis of a sample is performed, a measurement area of the sample is set. In the measurement area setting mode, a camera takes the image of the whole sample, and the image is shown on a display. An image of an aperture is superimposed on the image of the sample in the display. When an operator uses a mouse connected to a controller of the infrared microscope to change the width of the image of the aperture on the display, an aperture signal generator generates an aperture signal corresponding to the width of the aperture image. An aperture image signal generator receives the aperture signal and generates an aperture image signal having the width. Thus the image of the sample superimposed on the image of the aperture in the display changes accordingly, by which the operator confirms the measurement area, i.e., the position and width of the aperture, in the sample. Since the image of the aperture is generated electronically in the present invention, no hardware such as expensive lenses or a precise mirror-moving mechanism is necessary.
REFERENCES:
patent: 4877960 (1989-10-01), Messerschmidt et al.
Ohta Hiroshi
Takagi Nobuo
Wachi Tadashi
Nguyen Thong
Robinson Mark A.
Shimadzu Corporation
LandOfFree
Infrared microscope for analysis of a selected sample area does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Infrared microscope for analysis of a selected sample area, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Infrared microscope for analysis of a selected sample area will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1858305