Infrared measuring apparatus and method for on-line...

Radiant energy – Invisible radiant energy responsive electric signalling – Infrared responsive

Reexamination Certificate

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Details

C250S339060, C250S338100, C250S336100, C250S339100, C250S339120, C250S353000, C250S228000, C356S429000

Reexamination Certificate

active

06960769

ABSTRACT:
A single vane shutter flag is asynchronously controlled so that a measuring system light source is interrupted for a minimum necessary amount of time for standardization/calibration and normalization of InGaAs system detectors. Source/detector hemispheres or serially connected randomly oriented fiber bundles homogenize light passing to the detectors. Light source testing is performed by measuring spectral power distributions at a plurality of light source power levels and comparing the measurements to baseline characteristics established for the light source. Calibration sample life is extended indefinitely by controlling the shutter flag to block source light except for short calibration time periods during which standard light levels are provided.

REFERENCES:
patent: 3455637 (1969-07-01), Howard
patent: 3793524 (1974-02-01), Howarth
patent: 4027161 (1977-05-01), Williams et al.
patent: 4052615 (1977-10-01), Cho
patent: 4710807 (1987-12-01), Chikama
patent: 4733078 (1988-03-01), Sturm
patent: 4823008 (1989-04-01), Sturm
patent: 5067810 (1991-11-01), Bu-Abbud
patent: 5124552 (1992-06-01), Anderson
patent: 5243402 (1993-09-01), Weber et al.
patent: 5870926 (1999-02-01), Saito et al.
patent: 5967048 (1999-10-01), Fromson et al.
patent: 6215575 (2001-04-01), Tuchman
patent: 6365899 (2002-04-01), Arai et al.
patent: 6696685 (2004-02-01), Schumacher
patent: 6717148 (2004-04-01), Kansakoski et al.
patent: 2001/0033490 (2001-10-01), Koyama et al.
patent: 297 09 504 (1997-07-01), None
patent: 0 296 259 (1988-12-01), None
patent: 0 332 018 (1989-09-01), None
patent: WO 96/14567 (1996-05-01), None
patent: WO 01/59438 (2001-08-01), None
Patent Abstracts of Japan; vol. 018, No. 688 (P-1849), Dec. 26, 1994 & JP 06 273626 A (Matsuda Denshi Kogyo:KK), Sep. 30, 1994, abstract.

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