Infrared interference type film thickness measuring method and i

Details Infrared interference type film thickness measuring method and i Infrared interference type film thickness measuring method and i

1979-08-29

1981-03-03

Willis, Davis L.

Radiant energy

Invisible radiant energy responsive electric signalling

Infrared responsive

250341, 356357, G01J 100

Patent

active

042543371

ABSTRACT:
An infrared light is applied to a polymer film having a thickness of less than 30.mu., and the infrared light is spectroscopically separated before or after being applied to the polymer film to obtain an infrared interference fringe spectrum based on the polymer film, and then the extreme points of the infrared interference fringe spectrum are detected by processing, whereby to measure the thickness of the polymer film.

REFERENCES:
patent: 3238839 (1966-03-01), Day, Jr.
patent: 3601492 (1971-08-01), Reichard
patent: 3631526 (1971-12-01), Brunton
patent: 3693025 (1972-09-01), Brunton
patent: 3854044 (1974-12-01), Stay et al.
patent: 3973122 (1976-08-01), Goldberg
patent: 4027161 (1977-05-01), Williams et al.

Affiliated with

Also associated with

Rating

Infrared interference type film thickness measuring method and i does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Infrared interference type film thickness measuring method and i, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Infrared interference type film thickness measuring method and i will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-81741