Infrared imaging using thermal radiation from a scanning...

Radiant energy – Invisible radiant energy responsive electric signalling – Infrared responsive

Reexamination Certificate

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C250S339010, C250S339070, C250S339120, C850S033000, C850S050000, C850S052000, C850S062000

Reexamination Certificate

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07977636

ABSTRACT:
A method for performing sub-micron optical spectroscopy, using a heated SPM probe and far-field collection optics is described. The enhanced emission characteristics at a sharp heated tip constitute a highly localized wideband IR source. Thus the IR absorption and emission properties of a sample surface adjacent can be observed and measured in the farfield even though the interaction region is sub-micron in scale. . . . providing spatial resolution mapping of sample composition.

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patent: 2009/0205089 (2009-08-01), Jahnke

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