Optical: systems and elements – Having significant infrared or ultraviolet property – Multilayer filter or multilayer reflector
Reexamination Certificate
2011-04-19
2011-04-19
Amari, Alessandro (Department: 2872)
Optical: systems and elements
Having significant infrared or ultraviolet property
Multilayer filter or multilayer reflector
C359S723000
Reexamination Certificate
active
07929204
ABSTRACT:
An infrared cut filter includes a substrate, a first membrane group on the substrate, a second membrane group on the first membrane group and a third membrane group on the second membrane group. The first, second, third membrane groups include a plurality of first, second, third combined membranes. Each first combined membrane includes a high-refractive index membrane having an optical thickness of 1.2 times λ/4 and a low-refractive index membrane having an optical thickness of 0.6 times λ/8 in an alternating fashion. Each second combined membrane includes a high-refractive index membrane having an optical thickness of 1.1 times λ/4 and a low-refractive index membrane having an optical thickness of 1.1 times λ/8 in an alternating fashion. Each third combined membrane includes a high-refractive index membrane having an optical thickness of 1.3 times λ/4 and a low-refractive index membrane having an optical thickness of 1.3 times λ/8 in an alternating fashion.
REFERENCES:
patent: 5982423 (1999-11-01), Sekiguchi
patent: 7684113 (2010-03-01), Yamada et al.
patent: 2479526 (2002-02-01), None
patent: 1896770 (2007-01-01), None
patent: 06138317 (1994-05-01), None
Amari Alessandro
Cheng Andrew C.
Hon Hai Precision Industry Co. Ltd.
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