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Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing

Reexamination Certificate

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Reexamination Certificate

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07966587

ABSTRACT:
Conventionally, an excessively strict current limitation is often adopted. An interconnection apparatus includes an acquisition unit and a decision unit. The acquisition unit serves to acquire a current density and data rate of a region that a specific interconnect passes through. The decision unit serves to decide whether the temperature increase corresponding to the current density and the data rate acquired by the acquisition unit is within a permissible range.

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patent: 2004/0221217 (2004-11-01), Sato et al.
patent: 2009/0013290 (2009-01-01), Keinert et al.
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patent: 2000-163460 (2000-06-01), None
patent: 2001-308156 (2001-11-01), None
patent: 2005-346527 (2005-12-01), None
William R. Hunter, “Self-Consistent Solutions for Allowed Interconnect Current Density—Part I: Implications for Technology Evolution”, Feb. 1997, pp. 304-309; IEEE Transactions on Electron Devices, vol. 44, No. 2; 0018-9383/97.
Ting-Yen Chiang et al., “Impact of Joule Heating on Scaling of Deep Sub-Micron Cu/low-k Interconnects”, 2002 , 2 pages, Symposium on VLSI Technology Digest of Technical Papers, Department of Electrical Engineering, Stanford University.

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