Thermal measuring and testing – Thermal testing of a nonthermal quantity
Patent
1989-06-29
1990-03-13
Cuchlinski, Jr., William A.
Thermal measuring and testing
Thermal testing of a nonthermal quantity
374 17, 374 20, G01N 2500
Patent
active
049088351
ABSTRACT:
A method of measuring reliability of an information recording medium which comprises an information recording thin film. The method comprises the steps of heating said film at least once to its melting point, rapidly cooling said film after heating, measuring a transition temperature of said film after cooling, and comparing said transition temperature with a predetermined reference temperature.
REFERENCES:
patent: 2669863 (1954-02-01), Shapiro
patent: 4278734 (1981-07-01), Ohta et al.
patent: 4461807 (1984-07-01), Mori et al.
S.V. Biryukov, "Device for Automatic Melting-Point Determination for Crystalline SUbstances", Instrum. and Exp. Tech, vol. 24, no. 4, Feb. 1982 pp. 1088-1091.
Takenaga, et al., J. Appl. Phys. 54(9), Sep. 1983, pp. 5376-5379; TeO.sub.x Thin Films for an Optical DIsc Memory.
Akahira Nobuo
Nishiuchi Ken'ichi
Ohno Eiji
Yamada Noboru
Cuchlinski Jr. William A.
Matsushita Electric - Industrial Co., Ltd.
Worth W. Morris
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