Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate
2008-03-18
2008-03-18
Picard, Leo (Department: 2125)
Data processing: generic control systems or specific application
Specific application, apparatus or process
Product assembly or manufacturing
C700S109000, C700S110000, C382S141000
Reexamination Certificate
active
07346409
ABSTRACT:
There is provided an information processing apparatus that allows a user to understand what kinds of causes are accumulated stepwise in what kind of order to cause abnormality and due to what kinds of reasons respective causes occur from direct causes of the respective causes. The information processing apparatus includes: an inference unit that infers, when abnormality occurs in a product manufactured by manufacturing equipment and the abnormality is caused by stepwise accumulation of plural causes, a fundamental cause of the abnormality by specifying the causes stepwise and, at least at certain one stage, selectively specifying one cause out of two or more direct causes that cause a cause at the stage using at least inference data stored in advance; a reason acquiring unit that acquires, for each of the causes specified stepwise, data concerning reasons why the cause occurs from a storage device; and a display control unit that causes a display unit to display, for each of the reasons, the data concerning the respective reasons in association with related causes concerning the respective reasons.
REFERENCES:
patent: 5166934 (1992-11-01), Tomiyama et al.
patent: 5392359 (1995-02-01), Futamura et al.
patent: 5434955 (1995-07-01), Kumamoto
patent: 5501538 (1996-03-01), Sawada et al.
patent: 6014453 (2000-01-01), Sonoda et al.
patent: 6259960 (2001-07-01), Inokuchi
patent: 2005/0010445 (2005-01-01), Krishnan et al.
patent: 0 529 130 (1993-03-01), None
patent: 1 236 986 (2002-09-01), None
patent: 07-271599 (1995-10-01), None
patent: 10-055277 (1998-02-01), None
“Automated Optical Inspection Solutions,” Agilent Technologies, Online, Apr. 3, 2003, 12 Sheets, http://www.home.agilent.com/upload/cmc—upload/All/59889239en—073003.pdf>.
“Boundary-Scan Test and In-System Programming Software,” Coelis, Online, Mar. 6, 2005, 12 Sheets, www.corelis.com/products/Test—Software.htm>.
Kitamura et al., “Fault Diagnosis Based on Ontological Consideration of Faults—Exhaustive Fault Hypotheses Generation.” Journal of Japanese Society for Artificial Intelligence, Technical Papers, vol. 14, No. 5, 1999, pp. 838-848.
Kishimoto Mayuko
Matsushita Akira
Nakajima Yasuaki
Foley & Lardner LLP
Omron Corporation
Ortiz-Rodriguez Carlos
Picard Leo
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