Information handling system and printed circuit board having...

Radiant energy – Photocells; circuits and apparatus – Photocell controlled circuit

Reexamination Certificate

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Details

C250S559100

Reexamination Certificate

active

07728273

ABSTRACT:
A non-destructive test structure for printed circuit board characterization and method of testing the same are disclosed. In one form, a method for testing a printed circuit board can include applying a test signal to a first test location of a first test structure associated with a first inner bus layer of a printed circuit board. The method can also include measuring a crosstalk voltage at a second test location operably associated with the first test structure. The method can further include comparing the crosstalk voltage to a crosstalk specification of the printed circuit, board.

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patent: 6297458 (2001-10-01), McMillan et al.
patent: 6512181 (2003-01-01), Okubo et al.
patent: 6521841 (2003-02-01), Kawaguchi
patent: 6670816 (2003-12-01), Kim et al.
patent: 6714026 (2004-03-01), Kronrod
patent: 6922062 (2005-07-01), Sparkman
patent: 7002360 (2006-02-01), Kronrod
patent: 7129732 (2006-10-01), Knadle

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