Inferential temperature measurement of an electrochromic device

Details Inferential temperature measurement of an electrochromic device Inferential temperature measurement of an electrochromic device

2005-02-15

2005-02-15

Epps, Georgia (Department: 2873)

Optical: systems and elements

Optical modulator

Light wave temporal modulation

C345S105000

Reexamination Certificate

active

06856444

ABSTRACT:
An electrochromic device driver system having inferential temperature measurement of the electrochromic device. The inferred temperature measurements enable the system to determine the maximum but safe driving voltages to improve the speed of varying the transmissivity levels of the electrochromic device without damaging the device.

REFERENCES:
patent: 5973819 (1999-10-01), Pletcher et al.
patent: 6045724 (2000-04-01), Varaprasad et al.
patent: 6080964 (2000-06-01), Gmeiner
patent: 6222177 (2001-04-01), Bechtel et al.
patent: 6362806 (2002-03-01), Reichmann et al.
patent: 6614577 (2003-09-01), Yu et al.
patent: 1001307 (2000-05-01), None
patent: 11109423 (1999-04-01), None
patent: WO 9728484 (1997-07-01), None
patent: WO 0217008 (2003-02-01), None

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