Data processing: measuring – calibrating – or testing – Measurement system
Reexamination Certificate
2005-04-05
2005-04-05
Nghiem, Michael (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
C702S182000
Reexamination Certificate
active
06876943
ABSTRACT:
An improved system and method for producing replacement sensor signals for failed sensors, and inferred sensor signals for non-instrumented physical parameters, in processes and equipment having one or more sensors in place for monitoring physical parameters. A data history from a fully-instrumented prototype provides a representative data set of anticipated operating parameters for forming an empirical model in a computer module for generating “virtual” signals for a process or machine in real-time. Replacement or inferential sensor signals can be advantageously used in downstream control processing or analysis. A memory for storing the representative training set, or a transformation thereof, is coupled to a processor. The processor receives from an input data signals embodying real values from sensors actually on the process or machine, and may receive these in real-time. The processor is disposed to take a set of readings of the actual sensors from the input, mid generate an estimate of one or more desired inferred sensors, using a linear combination of the representative training set sensor data, as weighted by the result of a measure of similarity of the input sensor data to the representative training set sensor data.
REFERENCES:
patent: 4060716 (1977-11-01), Pekrul et al.
patent: 4639882 (1987-01-01), Keats
patent: 4707796 (1987-11-01), Calabro et al.
patent: 4761748 (1988-08-01), Le Rat et al.
patent: 4796205 (1989-01-01), Ishii et al.
patent: 4823290 (1989-04-01), Fasack et al.
patent: 4841456 (1989-06-01), Hogan, Jr. et al.
patent: 4937763 (1990-06-01), Mott
patent: 4985857 (1991-01-01), Bajpai et al.
patent: 5003950 (1991-04-01), Kato et al.
patent: 5025499 (1991-06-01), Inoue et al.
patent: 5093792 (1992-03-01), Taki et al.
patent: 5119287 (1992-06-01), Nakamura et al.
patent: 5119468 (1992-06-01), Owens
patent: 5213080 (1993-05-01), Lambert et al.
patent: 5223207 (1993-06-01), Gross et al.
patent: 5251285 (1993-10-01), Inoue et al.
patent: 5285494 (1994-02-01), Sprecher et al.
patent: 5309351 (1994-05-01), McCain et al.
patent: 5386373 (1995-01-01), Keeler et al.
patent: 5414632 (1995-05-01), Mochizuki et al.
patent: 5445347 (1995-08-01), Ng
patent: 5459675 (1995-10-01), Gross et al.
patent: 5481647 (1996-01-01), Brody et al.
patent: 5486997 (1996-01-01), Reismiller et al.
patent: 5495168 (1996-02-01), de Vries
patent: 5500940 (1996-03-01), Skeie
patent: 5539638 (1996-07-01), Keeler et al.
patent: 5548528 (1996-08-01), Keeler et al.
patent: 5553239 (1996-09-01), Heath et al.
patent: 5566092 (1996-10-01), Wang et al.
patent: 5596507 (1997-01-01), Jones et al.
patent: 5600726 (1997-02-01), Morgan et al.
patent: 5602733 (1997-02-01), Rogers et al.
patent: 5608845 (1997-03-01), Ohtsuka et al.
patent: 5623109 (1997-04-01), Uchida et al.
patent: 5629878 (1997-05-01), Kobrosly
patent: 5638413 (1997-06-01), Uematsu et al.
patent: 5668944 (1997-09-01), Berry
patent: 5680409 (1997-10-01), Qin et al.
patent: 5680541 (1997-10-01), Kurosu et al.
patent: 5682317 (1997-10-01), Keeler et al.
patent: 5699403 (1997-12-01), Ronnen
patent: 5708780 (1998-01-01), Levergood et al.
patent: 5710723 (1998-01-01), Hoth et al.
patent: 5714683 (1998-02-01), Maloney
patent: 5727144 (1998-03-01), Brady et al.
patent: 5748496 (1998-05-01), Takahashi et al.
patent: 5753805 (1998-05-01), Maloney
patent: 5754451 (1998-05-01), Williams
patent: 5757309 (1998-05-01), Brooks et al.
patent: 5761090 (1998-06-01), Gross et al.
patent: 5764509 (1998-06-01), Gross et al.
patent: 5784285 (1998-07-01), Tamaki et al.
patent: 5787138 (1998-07-01), Ocieczek et al.
patent: 5790977 (1998-08-01), Ezekiel
patent: 5796633 (1998-08-01), Burgess et al.
patent: 5817958 (1998-10-01), Uchida et al.
patent: 5842157 (1998-11-01), Wehhofer et al.
patent: 5845230 (1998-12-01), Lamberson
patent: 5845627 (1998-12-01), Olin et al.
patent: 5864773 (1999-01-01), Barna et al.
patent: 5886913 (1999-03-01), Marguinaud et al.
patent: 5905989 (1999-05-01), Biggs
patent: 5933352 (1999-08-01), Salut
patent: 5933818 (1999-08-01), Kasravi et al.
patent: 5956487 (1999-09-01), Venkatraman et al.
patent: 5961560 (1999-10-01), Kemner
patent: 5963884 (1999-10-01), Billington et al.
patent: 5970430 (1999-10-01), Burns et al.
patent: 5995916 (1999-11-01), Nixon et al.
patent: 6006260 (1999-12-01), Barrick, Jr. et al.
patent: 6023507 (2000-02-01), Wookey
patent: 6026348 (2000-02-01), Hala
patent: 6049741 (2000-04-01), Kawamura
patent: 6049827 (2000-04-01), Sugauchi et al.
patent: 6076088 (2000-06-01), Paik et al.
patent: 6110214 (2000-08-01), Klimasauskas
patent: 6115653 (2000-09-01), Bergstrom et al.
patent: 6236908 (2001-05-01), Cheng et al.
patent: 6356857 (2002-03-01), Qin et al.
patent: 6502082 (2002-12-01), Toyama et al.
patent: 6519552 (2003-02-01), Sampath et al.
patent: 6556939 (2003-04-01), Wegerich
patent: 6751575 (2004-06-01), Lenz et al.
patent: 20020087290 (2002-07-01), Wegerich et al.
patent: 20020183971 (2002-12-01), Wegerich et al.
patent: WO 0067412 (2000-11-01), None
Sowizral, H; “Virtual Sensors”; Proceedings SPIE International Society for Optical Engineering; vol. 2409; Feb. 7-9, 1995; pp 246-254.*
Spoelder, H; “Virtual Instrumentation and Virtual Environments” IEEE Instrumentation and Measurement Magazine; vol. 2, Issue 3; Sep. 1999; pp 14-19.*
Goodwin, G; “Evaluating the Performance of Virtual Sensors”; Proceedings Information, Decision and Control 1999; Feb. 8-10, 1999; pp 5-12.*
Various; “IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking”; Instrumentation and Measurement Technology Conference; vol. 2; May 19-21, 1997; pp i-xxiii.*
Long, T; Hanzevack, E; Bynum, W; “Sensor Fusion and Failure Detection Using Virtual Sensors”; Proceedings of the 1999 American Control Conference; vol. 4; Jun. 1999; pp 2417-2421.*
“Pneumatic and Thermal State Estimators for Production Engine Control and Diagnostics” by Peter J. Maloney and Peter M. Olin, SAE Technical Paper Series 980517, International Congress and Exposition, Feb. 23-26, 1998, Copyright 1998 Society of Automotive Engineers, Inc. (ISSN 0148-7191).
“Application of a New Technique for Modeling System Behavior” by Paul J. O'Sullivan, presented at the ISA Symposium, Edmonton, Alberta, May 1, 1991, © Copyright 1991 Instrument Society of America (21 pp.).
“A Universal, Fault-Tolerant, Non-Linear Analytic Network for Modeling and Fault Detection,” by J.E. Mott, R.W. King, L.R. Monson, D.L. Olson, and J.D. Staffon, Proceedings of the 8thPower Plant Dynamics, Control & Testing Symposium, Knoxville, Tennessee, May 27-29, 1992 (14pp.).
ModelWare™ Product Review by Robert D. Flori, reprinted from Computerized Investing, Sep./Oct. 1992, vol. XI, No. 5, copyright by the American Association of Individual Investors (pp. 8-10).
Modelware™ A New Approach to Prediction by Ken Tucker, reprinted from PC A1 magazine, Jan./Feb. 1993, pp. 14, 15, 30.
“Similarity Based Regression: Applied Advanced Pattern Recognition for Power Plant Analysis,” by E.J. Hansen and M.B. Caudill, presented at the 1994 EPRI Heat Rate Improvement Conference (9 pp.).
“Applied Pattern Recognition for Plant Monitoring and Data Validation,” by Ron Griebenow, E.J. Hansen, and A.L. Sudduth, presented at the Fifth International Joint ISA POWID/EPRI Controls and Instrumentation Conference, La Jolla, California, Jun. 19-21, 1995 (11 pp.).
“Model-Based Nuclear Power Plant Monitoring and Fault Detection: Theoretical Foundations,” by Ralph M. Singer, Kenny C. Gross, James P. Herzog, Ronald W. King, and Stephan Wegerich, presented at the International Conference on Intelligent System Application to Power Systems (ISAP '97), Jul. 6-10, 1997, Seoul, Korea (pp. 60-65).
“Application of a Model-Based Fault Detection System to Nuclear Plant Signals,” by K.C. Gross, R.M. Singer, S.W. Wegerich, J.P. Herzog, R. VanAlstine, and F. Bockhorst, presented at the International Conference on Intelligent Syste
Fitch Even Tabin & Flannery
Nghiem Michael
SmartSignal Corporation
Washburn Douglas N
LandOfFree
Inferential signal generator for instrumented equipment and... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Inferential signal generator for instrumented equipment and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Inferential signal generator for instrumented equipment and... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3396986