Inertial measurement system and method with sensor bias...

Details Inertial measurement system and method with sensor bias... Inertial measurement system and method with sensor bias...

2007-03-20

2007-03-20

Williams, Hezron (Department: 2856)

Measuring and testing

Instrument proving or calibrating

Angle, direction, or inclination

C073S504020

Reexamination Certificate

active

11072064

ABSTRACT:
Inertial measurement system and method in which a base is rotated about an input axis in accordance with a rotation to be measured, rotation about the input axis is sensed with one or more angular rate sensors, fixed bias offset is cancelled by dithering the sensors about an axis perpendicular to their sensing axes to vary the orientation of the sensing axes relative to the base in an oscillatory manner, and signals from the sensors are demodulated at the dithering frequency.

REFERENCES:
patent: 2995934 (1961-08-01), Harvey et al.
patent: 3619906 (1971-11-01), Yates et al.
patent: 3736791 (1973-06-01), Cantwell et al.
patent: 3757093 (1973-09-01), Licata
patent: 4399694 (1983-08-01), Mayer
patent: 5194872 (1993-03-01), Musoff et al.
patent: 5438410 (1995-08-01), Killpatrick et al.
patent: 2002/0174720 (2002-11-01), Cardarelli

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