Inductively coupled direct contact test probe

Details Inductively coupled direct contact test probe Inductively coupled direct contact test probe

2005-01-11

2005-01-11

Pert, Evan (Department: 2829)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With waveguide or long line

C324S1540PB

Reexamination Certificate

active

06841986

ABSTRACT:
A probe for measuring radio frequency/electromagnetic interference (RF/EMI) is used in combination with a spectrum analyzer or oscilloscope (measuring equipment) to measure and/or test for EMI in electronic equipment. The RF/EMI probe has high dielectric transformer isolation between the input of the measuring equipment and the circuit under test so as to prevent damaging the measuring equipment if a high voltage or current is encountered in the circuit being tested. The RF/EMI probe comprises a measurement tip connected to a shielded sense line, the shielded sense line is electro-magnetically coupled to a toroid forming a RF transformer, a high impedance termination load is connected to the shielded sense line, a shielded coaxial cable having a center conductor connected to a secondary winding on the toroid transformer, the shielded coaxial cable being adapted for connection to an input of the measuring equipment. The shield of the coaxial cable is continuous between the input connector of the measuring equipment and a shielded enclosure surrounding the toroid transformer. The coaxial cable may terminate in a RF connector, e.g., BNC and the like, for quick connection to and disconnection from the measuring equipment.

REFERENCES:
patent: 5206587 (1993-04-01), Rose
patent: 5793214 (1998-08-01), Wakamatsu

Affiliated with

Also associated with

Rating

Inductively coupled direct contact test probe does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Inductively coupled direct contact test probe, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Inductively coupled direct contact test probe will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3410214