Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Chemical analysis
Reexamination Certificate
2009-02-05
2011-10-04
Nghiem, Michael (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Chemical analysis
C702S019000, C702S022000, C702S030000
Reexamination Certificate
active
08032312
ABSTRACT:
An Inductive Probe/Conductive Probe Emulator is designed to replace conductive probes at a much lower cost than existing inductive probe systems. The conductivity probe simulator is usable with any industrial controller that uses a standard two wire conductivity probe interface. A continuously variable semiconductor resistive element is employed to match the conductivity of any conductive probe. The system uses the inductive probe reading to adjust the resistive element to the correct value. The conductivity probe simulator can be configured to emulate any conductivity probe with any probe constant by downloading configuration parameters to the probe controller or by setting configuration switches on the controller module. Additionally, the inventive probe simulator is equipped with an embedded temperature sensing element, giving the system a capability to perform a temperature correction in the controller section, if necessary.
REFERENCES:
patent: 4288854 (1981-09-01), Burroughs
patent: 4733798 (1988-03-01), Brady et al.
patent: 4773798 (1988-09-01), Gaster et al.
patent: 4971714 (1990-11-01), Lokkesmoe et al.
patent: 4976137 (1990-12-01), Decker et al.
patent: 5502532 (1996-03-01), Biesinger et al.
patent: 5722441 (1998-03-01), Teramoto
patent: 5826749 (1998-10-01), Howland et al.
patent: 5851108 (1998-12-01), Clymer et al.
patent: 5854557 (1998-12-01), Tiefnig
patent: 6319420 (2001-11-01), Dow
patent: 6423280 (2002-07-01), Tarara et al.
patent: 6529127 (2003-03-01), Townsend et al.
patent: 6792637 (2004-09-01), Reichold et al.
patent: 6892143 (2005-05-01), Howes et al.
patent: 7499810 (2009-03-01), Walker
patent: 2002/0096537 (2002-07-01), Gardner, Jr.
patent: 2003/0012081 (2003-01-01), Jungmann et al.
patent: 2005/0149273 (2005-07-01), Peterson et al.
Knight, LLC
Nghiem Michael
Stout Donald E.
Stout, Uxa Buyan & Mullins, LLP
Suarez Felix
LandOfFree
Inductive probe controller/conductive probe emulator does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Inductive probe controller/conductive probe emulator, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Inductive probe controller/conductive probe emulator will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4285691