Inductive debris monitor with multi-turn detector

Details Inductive debris monitor with multi-turn detector Inductive debris monitor with multi-turn detector

1992-11-10

1994-10-18

Wieder, Kenneth A.

Electricity: measuring and testing

Magnetic

Fluid material examination

324226, 324236, 340631, 73 6142, G01N 2774, G01N 3328, G01R 3312

Patent

active

053571975

ABSTRACT:
An inductive debris monitor for detecting chip-particles in tubing of a fluid wetted system. The inductive debris monitor includes a multi-turn detector and an electronic circuit having a resistor bridge configuration. The multi-turn probe detector wraps around the tubing of a fluid wetted system a plurality of times to detect the presence of the chip-particles while the electronic circuit analyzes and deciphers the detected chip-particle information.

REFERENCES:
patent: 4926120 (1990-05-01), Veronesi et al.
patent: 5001424 (1991-03-01), Kellett et al.
patent: 5041856 (1991-08-01), Veronesi et al.

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