Inductor devices – With outer casing or housing – Potted type
Reexamination Certificate
2008-04-16
2010-12-07
Mai, Anh T (Department: 2832)
Inductor devices
With outer casing or housing
Potted type
C336S090000, C336S229000, C336S092000, C029S602100
Reexamination Certificate
active
07847662
ABSTRACT:
An inductance element (1) includes a doughnut-shaped magnetic core (2) having a wound body or a stacked body of a magnetic ribbon, a bottomed container (3) in which the doughnut-shaped magnetic core (2) is housed, and a conductive lead portion (5) inserted into a hollow section of the doughnut-shaped magnetic core (2) housed in the bottomed container (3). An open section of the bottomed container (3) is covered with an adhesive portion (4) which integrally fixes the doughnut-shaped magnetic core (2), the bottomed container (3) and the conductive lead portion (5). The adhesive portion (4) is entered into a gap between the doughnut-shaped magnetic core (2) and the bottomed container (3) and a gap between the bottomed container (3) and the conductive lead portion (5) in a range of 5 to 50% in average to a thickness of the doughnut-shaped magnetic core (2).
REFERENCES:
patent: 4543554 (1985-09-01), Muellenheim et al.
patent: 4958134 (1990-09-01), Sawa et al.
patent: 6031442 (2000-02-01), Nakazawa
patent: 6774756 (2004-08-01), Zhao
patent: 7362201 (2008-04-01), Saegusa et al.
patent: 2003/0078005 (2003-04-01), Recht
patent: 58 164203 (1983-09-01), None
patent: 1 64311 (1989-03-01), None
patent: 5 79933 (1993-10-01), None
patent: 8 339932 (1996-12-01), None
patent: 2530277 (1996-12-01), None
patent: 2602843 (1997-04-01), None
patent: 10 251552 (1998-09-01), None
patent: 11 345714 (1999-12-01), None
patent: 2001 319814 (2001-11-01), None
patent: 2004 186573 (2004-07-01), None
patent: 2004-304064 (2004-10-01), None
U.S. Appl. No. 12/599,315, filed Nov. 9, 2009, Saito, et al.
U.S. Appl. No. 12/530,108, filed Sep. 4, 2009, Saito, et al.
JIS Z 2246:2000 “Shore hardness test-Test method”, Japanese Industrial Standard, (2000) (with English Translation).
JIS B 7727:2000 “Shore hardness test-Verification of testing machines”, Japanese Industrial Standard, (2000) (with English Translation).
JIS B 7731: 2000 “Shore hardness test-Calibration of reference blocks”, Japanese Industrial Standard. (2000) (with English translation).
Saito Tadao
Sakai Kazumi
Yamada Katsuhiko
Kabushiki Kaisha Toshiba
Mai Anh T
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
Toshiba Materials Co., Ltd.
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