Radiant energy – With charged particle beam deflection or focussing – With target means
Reexamination Certificate
2005-07-12
2005-07-12
Berman, Jack I. (Department: 2881)
Radiant energy
With charged particle beam deflection or focussing
With target means
C250S310000, C250S492200, C250S42300F
Reexamination Certificate
active
06917043
ABSTRACT:
Systems and method are described for addressable field emission array (AFEA) chips. A plurality of individually addressable cathodes are integrated with an electrostatic focusing stack and/or a plurality of detectors on the addressable field emission array. The systems and methods provide advantages including the avoidance of space-charge blow-up.
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Baylor Larry R.
Lowndes Douglas
Paulus Michael J.
Simpson Michael L.
Thomas Clarence E.
Berman Jack I.
Bruckner PC John
UT-Battelle LLC
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