Individual data line strobe-offset control in memory systems

Data processing: measuring – calibrating – or testing – Calibration or correction system – Signal frequency or phase correction

Reexamination Certificate

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C702S072000, C702S079000, C365S189070, C365S193000, C365S194000

Reexamination Certificate

active

07668679

ABSTRACT:
Systems and methods for strobe signal timing calibration and control in strobe-based memory systems are provided below. These strobe-offset control systems and methods receive a strobe signal from a memory device and in turn automatically generate separate per-bit strobe signals for use in receiving data on each data line of a memory system. The systems/methods generate the optimal per-bit strobe signals by automatically calibrating per-bit offset timing between data signals of individual data bits and corresponding strobe signals. The strobe-offset control system effectively removes the detected phase difference between the data signal and the strobe signal.

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