Indium tin oxide (ITO) layer forming

Liquid crystal cells – elements and systems – Nominal manufacturing methods or post manufacturing...

Reexamination Certificate

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C428S201000, C428S697000, C428S426000, C428S210000, C427S419200, C427S255230, C118S696000

Reexamination Certificate

active

08049862

ABSTRACT:
A layer of material, such as crystalline indium tin oxide (ITO), is formed on top of a substrate by heating the material to a high temperature, while a temperature increase of the substrate is limited such that the temperature of the substrate does not exceed a predetermined temperature. For example, a layer including amorphous ITO can be deposited on top of the substrate, and the amorphous layer can be heated in a surface anneal process using radiation while limiting substrate temperature. Another process can pass electrical current through the amorphous ITO. In another process, the substrate is passed through a high-temperature deposition chamber quickly, such that a portion of a layer of crystalline ITO is deposited, while the temperature increase of the substrate is limited.

REFERENCES:
patent: 5395663 (1995-03-01), Tabata et al.
patent: 5483261 (1996-01-01), Yasutake
patent: 5488204 (1996-01-01), Mead et al.
patent: 5825352 (1998-10-01), Bisset et al.
patent: 5835079 (1998-11-01), Shieh
patent: 5880411 (1999-03-01), Gillespie et al.
patent: 6188391 (2001-02-01), Seely et al.
patent: 6310610 (2001-10-01), Beaton et al.
patent: 6316343 (2001-11-01), Wada et al.
patent: 6323846 (2001-11-01), Westerman et al.
patent: 6690387 (2004-02-01), Zimmerman et al.
patent: 7015894 (2006-03-01), Morohoshi
patent: 7184064 (2007-02-01), Zimmerman et al.
patent: 7663607 (2010-02-01), Hotelling et al.
patent: 2002/0016075 (2002-02-01), Peng et al.
patent: 2003/0134122 (2003-07-01), Wickboldt et al.
patent: 2006/0003188 (2006-01-01), Ohno et al.
patent: 2006/0026521 (2006-02-01), Hotelling et al.
patent: 2006/0097991 (2006-05-01), Hotelling et al.
patent: 2006/0197753 (2006-09-01), Hotelling
patent: 2010/0035030 (2010-02-01), Huang et al.
patent: 01-009893 (1989-01-01), None
patent: 2000/163031 (2000-06-01), None
patent: 2002/342033 (2002-11-01), None
patent: 2008-170840 (2008-07-01), None
patent: WO-2007/146785 (2007-12-01), None
patent: WO-2007/146785 (2007-12-01), None
patent: WO-2010/017054 (2010-02-01), None
patent: WO-2010/017054 (2010-02-01), None
International Search Report mailed Jan. 29, 2010, for PCT Application No. PCT/US2009/051876, filed Jul. 27, 2009, three pages.
Lee, S.K. et al. (Apr. 1985). “A Multi-Touch Three Dimensional Touch-Sensitive Tablet,”Proceedings of CHI: ACM Conference on Human Factors in Computing Systems, pp. 21-25.
Rogozin, A. et al. (2006). “Annealing of Indium Tin Oxide Films by Electric Current: Properties and Structure Evolution,”Applied Physics Letters, three pages.
Rubine, D.H. (Dec. 1991). “The Automatic Recognition of Gestures,” CMU-CS-91-202, Submitted in Partial Fulfillment of the Requirements of the Degree of Doctor of Philosophy in Computer Science at Carnegie Mellon University, 285 pages.
Rubine, D.H. (May 1992). “Combining Gestures and Direct Manipulation,” CHI '92, pp. 659-660.
Westerman, W. (Spring 1999). “Hand Tracking, Finger Identification, and Chordic Manipulation on a Multi-Touch Surface,” A Dissertation Submitted to the Faculty of the University of Delaware in Partial Fulfillment of the Requirements for the Degree of Doctor of Philosophy in Electrical Engineering, 364 pages.

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