Indicator for determining the sensitivity of a radiological defe

Details Indicator for determining the sensitivity of a radiological defe Indicator for determining the sensitivity of a radiological defe

1985-11-14

1987-05-26

Schmidt, Frederick R.

X-ray or gamma ray systems or devices

Specific application

Absorption

378207, G01D 1800

Patent

active

046691049

ABSTRACT:
An indicator for determining the sensitivity of a radiological defect testing device which simulates plane defects within a workpiece. Two or more tapered elements are placed side by side on a support such that parallel, adjacent sides define the plane defects. The elements are oriented such that the plane defect extends generally parallel to the direction of the radiation.

REFERENCES:
patent: 4028545 (1977-06-01), Foster
patent: 4055771 (1977-10-01), Goodenough et al.
patent: 4280047 (1981-07-01), Enos
patent: 4400827 (1983-08-01), Spears
patent: 4460832 (1984-07-01), Bigham
patent: 4527057 (1985-07-01), Guyton et al.
R. McMaster: "Non Destructive Testing Handbook", vol. 1, 1959, pp. 20.36-20.38, section 20; Film Radiography, paragraph Penetrameters.
Photographic, Science & Engineering, vol. 6, No. 5, 1962, pp. 289-293; H. De Ben: "Perception of Small Detail in Industrial Radiographs".
Medical Physics, vol. 3, No. 1, Jan. 1976, pp. 19-25, New York, US; A. Jacobson: "Test Cassette for Measuring Peak Tube Potential of Diagnostic X-Ray Machines".

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