Independently controlled read and write head stripe height...

Details Independently controlled read and write head stripe height... Independently controlled read and write head stripe height...

2005-04-26

2005-04-26

Nguyen, Dung Van (Department: 3723)

Abrading

Precision device or process - or with condition responsive...

Computer controlled

C451S008000

Reexamination Certificate

active

06884148

ABSTRACT:
A lapping guide system and method for lapping a merged read/write head are disclosed. The resistance RREof a first ELG near the sensor in the read head is correlated to the resistance RWEof a second ELG and to the width of a first optical lapping guide (OLG) near the neck region of the write head. As the lapping progresses, RWEand RREincrease and the OLG width along the lapping plane increases. Thus, an OLG width and a RWEcorresponding to a target neck height or throat height and a RREcorresponding to a target stripe height are determined. A lapping plane is actively tilted to enable write head dimensions to be independently controlled on a per wafer or per row basis. The first OLG is a triangular feature with one side parallel to the lapping plane and the other two sides converging near the lapping plane.

REFERENCES:
patent: 5772493 (1998-06-01), Rottmayer et al.
patent: 6003361 (1999-12-01), Amin et al.
patent: 6193584 (2001-02-01), Rudy et al.

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