Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2006-02-07
2006-02-07
Tran, Phuoc (Department: 2621)
Image analysis
Applications
Manufacturing or product inspection
C382S199000
Reexamination Certificate
active
06996264
ABSTRACT:
An indentation hardness test system includes a frame having a movable turret, a movable stage for receiving a part, a camera, a display, a processor and a memory subsystem. The turret includes an objective lens of a microscope and an indenter and the movable stage is configured for receiving the part to be tested. The camera captures images of the part through the microscope, which can then be provided on the display. The processor is coupled to the turret, the movable stage, the camera and the display, as well as the memory subsystem. The memory subsystem stores executable code that instructs the processor to capture and store a series of real-time images of the part using the camera, store associated stage coordinates provided by the stage for the images and display a composite image, which includes the series of real-time images assembled according to the associated stage coordinates, of the part.
REFERENCES:
patent: 4589140 (1986-05-01), Bishop et al.
patent: 4618938 (1986-10-01), Sandland et al.
patent: 4757550 (1988-07-01), Uga
patent: 4764969 (1988-08-01), Ohtombe et al.
patent: 4825388 (1989-04-01), Dailey et al.
patent: 4945490 (1990-07-01), Biddle et al.
patent: 5022089 (1991-06-01), Wilson
patent: 5146779 (1992-09-01), Sugimoto et al.
patent: 5264919 (1993-11-01), tsukada
patent: 5486924 (1996-01-01), Lacey
patent: 5513275 (1996-04-01), Khalaj et al.
patent: 5517235 (1996-05-01), Wasserman
patent: 5586058 (1996-12-01), Aloni et al.
patent: 5592563 (1997-01-01), Zahavi
patent: 5619429 (1997-04-01), Aloni et al.
patent: 5717780 (1998-02-01), Mitsumune et al.
patent: 5768401 (1998-06-01), Csipkes et al.
patent: 5796861 (1998-08-01), Vogt et al.
patent: 5949389 (1999-09-01), Brown
patent: 5987189 (1999-11-01), Schmucker et al.
patent: 5991461 (1999-11-01), Schmucker et al.
patent: 5999262 (1999-12-01), Dobschal et al.
patent: 6031930 (2000-02-01), Bacus et al.
patent: 6078681 (2000-06-01), Silver
patent: 6101265 (2000-08-01), Bacus et al.
patent: 6144028 (2000-11-01), Kley
patent: 6201899 (2001-03-01), Bergen
patent: 6219437 (2001-04-01), Baldur
patent: 6226392 (2001-05-01), Bacus et al.
patent: 6268611 (2001-07-01), Pettersson et al.
patent: 6272235 (2001-08-01), Bacus et al.
patent: 6345129 (2002-02-01), Aharon
patent: 6347150 (2002-02-01), Hiroi et al.
patent: 6360005 (2002-03-01), Aloni et al.
patent: 6362832 (2002-03-01), Stephan et al.
patent: 6587597 (2003-07-01), Nakao et al.
patent: 6731390 (2004-05-01), Schoeppe
patent: 2001/0030654 (2001-10-01), Ikl
patent: 2002/0036775 (2002-03-01), Wolleschensky et al.
patent: 2003/0231408 (2003-12-01), Wolleschensky
patent: 2004/0095576 (2004-05-01), Wolleschensky
patent: 2004/0159797 (2004-08-01), Wolleschensky
Mitutoyo Technical Data, Bulletin No. 1463, “Auto Vickers Hardness Testing System AAV-602,” Mitutoyo American Corporation, Aurora, Illinois, Oct. 2000 (2 pages).
U.S. Patent Application Publication No. 2002/0128913, Sep. 12, 2002, Kotake et al.
U.S. Patent Application Publication No. 2002/0047895, Apr. 25, 2002, Bernardo et al.
U.S. Patent Application Publication No. 2002/0034338, Mar. 21, 2002, Askery.
Barfoot David Andrew
Hauck John Michael
Leco Corporation
Price Heneveld Cooper DeWitt & Litton LLP
Tran Phuoc
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