Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1979-06-04
1981-10-27
Punter, William H.
Optics: measuring and testing
By polarized light examination
With light attenuation
250237G, G01B 1114, G01B 1104
Patent
active
042970334
ABSTRACT:
An incremental photoelectric measuring device is described including a measuring scale having a line grid and a scanning plate having a line grid, wherein the grid spacings of the two line grids are unequal such that one is an integral multiple of the other. Preferably the scale is provided with the coarser, less expensive to manufacture, line grid and the scanning plate is provided with the finer line grid. In this case the resolution of the measuring device is governed by the fine line grid of the scanning plate which can readily be changed to alter the resolution of the device. Two preferred separations between the scale and the scanning plate are described, which separations provide refraction doubling of the coarser line grid and enhanced spatial precision, respectively.
REFERENCES:
patent: 3166624 (1965-01-01), Vargady
patent: 3427463 (1969-02-01), Weyrauch
patent: 3796498 (1974-03-01), Post
patent: 3812352 (1974-05-01), MacGovern
patent: 3842261 (1974-10-01), MacGovern et al.
Machine Shop Magazine, 4-62, pp. 208-209.
Zverev, A. E., Translation of USSR Inventors Certificate #127552.
Dr. Johannes Heidenhain GmbH
Punter William H.
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