Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1981-10-05
1984-10-30
Rosenberger, R. A.
Optics: measuring and testing
By polarized light examination
With light attenuation
33125C, 250237G, G01D 5245
Patent
active
044797168
ABSTRACT:
An incremental length or angle measuring instrument includes a scale having a line grid and a plurality of reference marks. A scanning unit is provided with a plurality of photosensors to scan both the line grid and the reference marks. A reference mark selecting arrangement is described which includes a light source and a photosensor. This selecting arrangement acts to select a subset of the reference marks from the total number of reference marks and to bring only this selected subset of reference marks into operation. This selection takes place through the allocation of a light source or a reflecting element to each of the selected reference marks. The scanning unit operates to generate two square wave scanning signals, a reference signal in response to the reference marks and a selection signal in response to the presence or absence of the light source or the reflecting element associated with the selected reference marks. A logic circuit is provided which is responsive to the reference signals and to the selection signals such that a control signal is generated by the logic circuit only if both the reference signal and the selection signal are present simultaneously. The light sources or reflecting elements which serve to designate the selected reference marks can arbitrarily be moved as necessary such that the selected subset of reference marks can be freely and arbitrarily chosen from the total number of reference marks readily and without alteration of the scale itself.
REFERENCES:
patent: 3867036 (1975-02-01), Detwiler et al.
patent: 4101764 (1978-07-01), Nelle
patent: 4363964 (1982-12-01), Schmitt
Johannes Heidenhain GmbH
Rosenberger R. A.
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