Electricity: electrical systems and devices – Housing or mounting assemblies with diverse electrical... – For electronic systems and devices
Reexamination Certificate
2005-05-10
2005-05-10
Thompson, Gregory D. (Department: 2835)
Electricity: electrical systems and devices
Housing or mounting assemblies with diverse electrical...
For electronic systems and devices
C165S080200, C165S185000, C174S016300, C361S707000, C361S708000, C361S718000, C361S719000, C361S722000, C428S216000, C428S408000
Reexamination Certificate
active
06891724
ABSTRACT:
The invention relates to a structure of and a process of forming an integrated circuit package that utilizes a thermal interface material layer having an aligned array of carbon nanotubes affixed to a surface of the layer. The thermal interface material is diamond deposited by chemical vapor deposition. The carbon nanotubes are formed by a plasma discharge process on the surface of the CVDD and also may be formed on the surface of the die.
REFERENCES:
patent: 5316080 (1994-05-01), Banks et al.
patent: 5604037 (1997-02-01), Ting et al.
patent: 5825624 (1998-10-01), Arnold et al.
patent: 5837081 (1998-11-01), Ting et al.
patent: 5965267 (1999-10-01), Nolan et al.
patent: 6407922 (2002-06-01), Eckblad et al.
patent: 6504292 (2003-01-01), Choi et al.
patent: 6651736 (2003-11-01), Chiu et al.
patent: 20020105071 (2002-08-01), Mahajan et al.
patent: 20030135971 (2003-07-01), Liberman et al.
patent: 20030179559 (2003-09-01), Engelhardt et al.
patent: 20040150100 (2004-08-01), Dubin et al.
patent: 0538798 (1993-04-01), None
patent: 0689244 (1995-12-01), None
US 2003/0117770 Montgomery et al “Carbon Nanotube Thermal Interface Structures”, Jun. 2003.*
“High Conduction Thermal Interface Material”,IBM Technical Disclosure Bulletin, 36 (10), IBM Corp., NY, US, (1993), 581-583.
De Lorenzo David S.
Fite Robert J.
Montgomery Stephen W.
Intel Corporation
Schwegman Lundberg Woessner & Kluth P.A.
Thompson Gregory D.
LandOfFree
Increasing thermal conductivity of thermal interface using... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Increasing thermal conductivity of thermal interface using..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Increasing thermal conductivity of thermal interface using... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3371974