Increased yield manufacturing for integrated circuits

Details Increased yield manufacturing for integrated circuits Increased yield manufacturing for integrated circuits

2007-08-28

2007-08-28

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S073100, C438S017000

Reexamination Certificate

active

11166328

ABSTRACT:
A system and method for providing increased manufacturing yield for integrated circuits. Various aspects of the invention may comprise receiving an integrated circuit designed to operate at nominal power supply characteristics. The integrated circuit may, for example, be tested at nominal power supply characteristics to determine if the integrated circuit meets performance requirements at nominal power supply characteristics, if the integrated circuit meets performance requirements at nominal power supply characteristics, then the integrated circuit may be designated as such and further processed accordingly. Such a designation may, for example be visible, electronic or procedural. Various aspects of the present invention may also comprise testing the integrated circuit at non-nominal power supply characteristics to determine if the integrated circuit meets performance requirements at non-nominal power supply characteristics. If the integrated circuit meets performance requirements at non-nominal power supply characteristics, then the integrated circuit may be designated as such and further processed accordingly.

REFERENCES:
patent: 5541547 (1996-07-01), Lam
patent: 6198261 (2001-03-01), Schultz et al.
patent: 7023230 (2006-04-01), Allen, III et al.
patent: 2004/0082086 (2004-04-01), Arabi et al.
patent: 2005/0188230 (2005-08-01), Bilak

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