Increased quality factor of a varactor in an integrated...

Active solid-state devices (e.g. – transistors – solid-state diode – Voltage variable capacitance device – With specified housing or contact

Reexamination Certificate

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C257S595000

Reexamination Certificate

active

07345354

ABSTRACT:
The present invention provides an varactor, a method of manufacture thereof. In an exemplary embodiment, the varactor includes a semiconductor substrate and well of a first and second conductivity type, respectively. A conductive region in the well has a same conductivity type as the well but a lower resistivity than the well. At least a portion of the well is between at least two sides of the conductive region and an area delineated by an outer perimeter of a conductive layer over the well. Such varactors have a lower series resistance and therefore have an increased quality factor.

REFERENCES:
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patent: 5965912 (1999-10-01), Stolfa et al.
patent: 6100770 (2000-08-01), Litwin et al.
patent: 6686640 (2004-02-01), Mheen et al.
patent: 2001/0042879 (2001-11-01), Ghilardelli et al.
patent: 02209776 (1990-08-01), None
Parent case U.S. Appl. No. 10/454,133, filed on Jun. 4, 2003 entitled “Increased Quality Factor of a Varactor in an Integrated Circuit Via a High Conductive Region in a Well” to Shye Shapira et al.; allowed on May 24, 2004.

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