Increase spatial sampling for wave front mid-spatial...

Details Increase spatial sampling for wave front mid-spatial... Increase spatial sampling for wave front mid-spatial...

2008-04-04

2009-11-17

Epps, Georgia Y (Department: 2878)

Radiant energy

Photocells; circuits and apparatus

Photocell controls its own optical systems

C250S208100, C356S512000, C359S849000

Reexamination Certificate

active

07619191

ABSTRACT:
A differential curvature sensing device for measuring a wavefront curvature by employing increased spatial sampling for wavefront testing with mid-frequency error recovery. The device includes a sampling sensor having an output beam, an optical element to split said output beam, a lenslet array in the path of each beam to generate corresponding sampling grids, a shearing element for shifting the grid points in horizontal and vertical directions to produce plural sampling grids having plural grid points for use generating a spatial sampling grid having a density for mid-spatial frequency recovery. The displacement of the shifting less than a pitch size of the lenslet array, and a measuring device measuring plural slopes of plural wavefronts at each grid point to obtain a wavefront normal curvature and corresponding twist curvature terms to determine a principal curvature and directions. The sensor is a Shack-Hartman sensor, shearing interferometer sensor and other discrete-point sampling sensors.

REFERENCES:
patent: 6130419 (2000-10-01), Neal
patent: 7078665 (2006-07-01), Topa
patent: 7390999 (2008-06-01), Zou et al.

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