Increase productivity at wafer test using probe retest data...

Details Increase productivity at wafer test using probe retest data... Increase productivity at wafer test using probe retest data...

2008-07-09

2009-08-11

Tang, Minh N (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S073100

Reexamination Certificate

active

07573284

ABSTRACT:
Disclosed is a method and system for wafer/probe testing of integrated circuit devices after manufacture. The invention begins by testing an initial group of devices (e.g., integrated circuit chips) to produce an initial failing group of devices that failed the testing. The devices in the initial failing group are identified by type of failure. Then, the invention retests the devices in the initial failing group to identify a retested passing group of devices that passed the retesting. Next, the invention analyzes the devices in the retested passing group which allows the invention to produce statistics regarding the likelihood that a failing device that failed the initial testing will pass the retesting according to the type of failure. Then, the invention evaluates these statistics to determine which types of failures have retest passing rates above a predetermined threshold. From this, the invention produces a database comprising an optimized retest table listing the types of defects that are approved for retesting.

REFERENCES:
patent: 5764650 (1998-06-01), Debenham
patent: 5867505 (1999-02-01), Beffa
patent: 6043101 (2000-03-01), Stubblefield et al.
patent: 6078189 (2000-06-01), Noel
patent: 6240329 (2001-05-01), Sun
patent: 6350959 (2002-02-01), Beffa
patent: 6499118 (2002-12-01), Michaelson
patent: 6507800 (2003-01-01), Sheu
patent: 6618682 (2003-09-01), Bulaga et al.
patent: 6728652 (2004-04-01), Kobayashi
patent: 7017429 (2006-03-01), Schuntermann et al.
patent: 7027946 (2006-04-01), Williams et al.
patent: 7253650 (2007-08-01), Balchiunas
patent: 7463047 (2008-12-01), Balchiunas
patent: 2003/0120445 (2003-06-01), Barbour et al.
patent: 2003/0139839 (2003-07-01), Beffa
patent: 05-074878 (1993-03-01), None

Affiliated with

Also associated with

Rating

Increase productivity at wafer test using probe retest data... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Increase productivity at wafer test using probe retest data..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Increase productivity at wafer test using probe retest data... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4068982