Incorporation of isolation resistor(s) into probes using...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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Reexamination Certificate

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10918285

ABSTRACT:
An isolation resistor is incorporated into the plunger of a probe tip spring pin by, for example, doping a ceramic that is used to form the plunger, or forming the plunger of first and second electrically coupled materials, at least a first of which has a resistivity sufficient to serve as an isolation resistor. Alternately, an isolation resistor is embedded in a printed circuit board trace that is used to couple either an upper or lower blind plated hole to a via. A probe tip spring pin is then inserted into the upper blind plated hole.

REFERENCES:
patent: 4883443 (1989-11-01), Chase
patent: 6462570 (2002-10-01), Price et al.
patent: 6469530 (2002-10-01), Johnson et al.
patent: 6512389 (2003-01-01), Kocher
patent: 6570399 (2003-05-01), Yeghiayan et al.
patent: 6624647 (2003-09-01), Adams et al.
patent: 6756797 (2004-06-01), Brandorff et al.
patent: 6778198 (2004-08-01), Dances
Brent A. Holcombe, et al., Connector-Less Probe, U.S. Appl. No. 10/373,820, filed Feb. 25, 2003.
Brent A. Holcombe, et al., “Alignment/Retention Device for Connector-Less Probe”, U.S. Appl. No. 10/644,365, filed Aug. 20, 2003.
Brock J. LaMeres, et al., “Backside Attach Probe, Components thereof, and Methods for Making and Using Same”, U.S. Appl. No. 10/902,405, filed on Jul. 28, 2004.
Brock J. LaMeres, et al., “Probes with Perpendicularly Disposed Spring Pins, and Methods of Making and Using Same”, U.S. Appl. No. 10/781,086, filed Feb. 17, 2004.

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